Intellectual Property Law

US Patent 7619810 - MEMS array testing

This patent from IDC LLC (now part of Qualcomm) has very early priority (1994) and includes very basic claims to array-based testing of micromechanical devices. Claim 23 reads:

23. A system comprising:

an array of nodes organized into rows and columns, each node having a micro-electromechanical (MEM) device, a first switch coupling a column line to the MEM device and a second switch coupling a voltage to the MEM device; and,

a testing mechanism situated outside of the array of nodes to test each node for proper operation by selecting a row and a column of the nodes in which the node is located to turn on the first and the second switches of the node.

Full post as published by TinytechIP on November 23, 2009 (boomark / email).